Jillavenkatesa, Ajit. <br/><br/>
Particle size characterization  [microform] / 
Ajit Jillavenkatesa, Stanley J. Dapkunas, Lin-Sien H. Lum. 
 - [Gaithersburg, Md.] :  Washington, D.C. :  U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ;  For sale by the Supt. of Docs., U.S. G.P.O.,  [2001] 
 - v, 165 p. :  ill. ;  23 cm. 
 - NIST special publication ;  no. 960-1 NIST recommended practice guide .
<br/><br/> "January 2001."  Shipping list no.: 2001-0333-M. 
<br/><br/>Includes bibliographical references. 
<br/><br/>
<br/><br/><br/>Microfiche. <br/>[Washington, D.C.] : <br/>Supt. of Docs., U.S. G.P.O., <br/>2001. <br/>2 microfiches : negative. 
<br/><br/><label>Source: </label>003-003-03671-4  GPO  $12.00  paper copy 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Particle size determination.<br/>Particles.