Secondary school examinations : international perspectives on policies and practice / Max A. Eckstein and Harold J. Noah.

By: Contributor(s): Material type: TextPublication details: New Haven : Yale University Press, c1993.Description: xi, 283 p. : ill. ; 25 cmISBN:
  • 0300053932
Subject(s): LOC classification:
  • LB 3060.28 .E25 1993
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Includes bibliographical references and index.

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